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AFM, SEM Calibration Specimens 302-EDU, unmounted

E80124-EDU

SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
€853.50 €1,015.67

Product Details

More Information

More Information
Application
SEM
Type
Calibration Standards
Packing Unit each

  • Exclusive
    Partner of:

 
  • Zeiss