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High Resolution Calibration Standard Modell 70-1D with Certificate, unmounted
E80127-1DC
Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB. A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
€6,391.40
€7,605.77
Product Details
More Information
| Application |
SEM
|
|---|---|
| Type |
Calibration Standards
|
| Magnification | high magnification |
| Packing Unit | each |
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