With GATTA‑AFM nanorulers, now adequate test samples are finally available. The GATTA-AFM nanorulers represent accurate and highly parallelized structures and are therefore perfectly suited to optimize and test the resolution of atomic force microscopes.
For very high resolution performance testing this specimen has a smaller gold particle size ranging from <3nm to 50nm as compared to the high resolution test above. Ideal for testing at instrument magnifications of 50,000x and above.
With gold particles ranging from <2nm to 30nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.