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(99)
    • €405.90 €483.02
      Art.Nr: E80124-PT
      SPM Calibration Specimen, random hard and soft domain as small as 10nm, Polymer, mounted on 15mm steel disk.
      €405.90 €483.02
      • €621.90 €740.06
        Art.Nr: E80124-HD
        SPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.
        €621.90 €740.06
        • €853.50 €1,015.67
          Art.Nr: E80124-EDU
          SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
          €853.50 €1,015.67
          • €2,263.30 €2,693.33
            Art.Nr: E80123-2D
            SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
            €2,263.30 €2,693.33
            • €970.90 €1,155.37
              Art.Nr: E80123-1D
              SPM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
              €970.90 €1,155.37
              • €1,520.80 €1,809.75
                Art.Nr: E80122-2D
                SPM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
                €1,520.80 €1,809.75
                • €849.90 €1,011.38
                  Art.Nr: E80122-1D
                  SPM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted on 15mm steel disk.
                  €849.90 €1,011.38
                  • €2,440.40 €2,904.08
                    Art.Nr: E80111-31M
                    SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.
                    €2,440.40 €2,904.08
                    • €2,219.20 €2,640.85
                      Art.Nr: E80111-31
                      SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.
                      €2,219.20 €2,640.85
                      • €1,532.20 €1,823.32
                        Art.Nr: E80110-72M
                        SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.
                        €1,532.20 €1,823.32
                        • €1,297.30 €1,543.79
                          Art.Nr: E80110-72
                          SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                          €1,297.30 €1,543.79
                          • €884.40 €1,052.44
                            Art.Nr: E80110-71M
                            SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.
                            €884.40 €1,052.44
                            • €725.90 €863.82
                              Art.Nr: E80110-71
                              SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                              €725.90 €863.82
                              • Art.Nr: E80110-32M
                                SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
                                • Art.Nr: E80110-32
                                  SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                                  • €1,096.50 €1,304.84
                                    Art.Nr: E80110-31M
                                    SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
                                    €1,096.50 €1,304.84
                                    • €861.60 €1,025.30
                                      Art.Nr: E80110-31
                                      SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                                      €861.60 €1,025.30
                                      • Art.Nr: TL80069
                                        The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.
                                        • €117.60 €139.94
                                          Art.Nr: E80055
                                          The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.
                                          €117.60 €139.94
                                          • €113.50 €135.07
                                            Art.Nr: E80051
                                            Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.
                                            €113.50 €135.07
                                            • €105.20 €125.19
                                              Art.Nr: E80050
                                              Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.
                                              €105.20 €125.19
                                              • €41.50 €49.39
                                                Art.Nr: P80037
                                                Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                                €41.50 €49.39
                                                • €59.50 €70.81
                                                  Art.Nr: P80036
                                                  Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                                  €59.50 €70.81
                                                  • €38.10 €45.34
                                                    Art.Nr: P80035
                                                    Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                                    €38.10 €45.34
                                                    • €38.10 €45.34
                                                      Art.Nr: P80020
                                                      Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.
                                                      €38.10 €45.34
                                                      • €84.20 €100.20
                                                        Art.Nr: P80014
                                                        Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.
                                                        €84.20 €100.20
                                                        • €21.50 €25.59
                                                          Art.Nr: E80010
                                                          Holey Carbon Film for measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various Sizes. On a 3.05mm copper grid.
                                                          €21.50 €25.59
                                                          • Art.Nr: P79526-10
                                                            These fine mesh grids are suitable for the low magnification range of a TEM.
                                                            • €76.60 €91.15
                                                              Art.Nr: E79525-02
                                                              These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.
                                                              €76.60 €91.15
                                                              • €41.50 €49.39
                                                                Art.Nr: P79525-01
                                                                These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.
                                                                €41.50 €49.39