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Size Standards
(45)
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Starting at€453.90 €540.14
Mikrometer Scala 20mm in 0,01mm Teilung.This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background. The glas discs are mounted in stainless steel slides.Starting at €453.90 €540.14
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Starting at€342.40 €407.46
Type: horizontal, Length: 0,1", Nos. Div.: 100, Div. Size: 0,001". The glas discs are mounted in stainless steel slides.Starting at €342.40 €407.46
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Starting at€380.40 €452.68
Type: horizontal, Length: 10mm, Nos. Div.: 100, Div. Size: 0,1mm. The glas discs are mounted in stainless steel slides.Starting at €380.40 €452.68
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Starting at€275.60 €327.96
Type: horizontal, Length: 10mm, Nos. Div.: 100, Div. Size: 0,1mm.Starting at €275.60 €327.96
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Starting at€275.60 €327.96
Type: horizontal, Length: 0,1", Nos. Div.: 100, Div. Size: 0,001".Starting at €275.60 €327.96
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Starting at€342.40 €407.46
Mikrometer Scala 1mm in 0,01mm Teilung.This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background. The glas discs are mounted in stainless steel slides.Starting at €342.40 €407.46
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Starting at€275.60 €327.96
Mikrometer Skala 1mm in 0,01mm Teilung.This scale is etched through highly reflective vacuum coated metal. When viewed under vertical illumination, as with a metallurgical microscope, the scale appears black against a bright background.Starting at €275.60 €327.96
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€6,391.40 €7,605.77Art.Nr: E80127-1DCVery High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB. A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.€6,391.40 €7,605.77 -
€1,297.30 €1,543.79Art.Nr: E80125-1DSPM Calibration Specimen, parallel ridges, 150nm nominal Abstand, A1 Lines on Glass, unmounted.€1,297.30 €1,543.79 -
€621.90 €740.06Art.Nr: E80124-HDSPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.€621.90 €740.06
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€853.50 €1,015.67Art.Nr: E80124-EDUSPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€853.50 €1,015.67
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€2,440.40 €2,904.08Art.Nr: E80111-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.€2,440.40 €2,904.08
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€2,219.20 €2,640.85Art.Nr: E80111-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.€2,219.20 €2,640.85
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€1,532.20 €1,823.32Art.Nr: E80110-72MSEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,532.20 €1,823.32
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€1,297.30 €1,543.79Art.Nr: E80110-72SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€1,297.30 €1,543.79
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€884.40 €1,052.44Art.Nr: E80110-71MSEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€884.40 €1,052.44
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€725.90 €863.82Art.Nr: E80110-71SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€725.90 €863.82
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Art.Nr: E80110-32MSEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
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Art.Nr: E80110-32SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
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€1,096.50 €1,304.84Art.Nr: E80110-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,096.50 €1,304.84
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€861.60 €1,025.30Art.Nr: E80110-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€861.60 €1,025.30
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Art.Nr: TL80069The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x. -
€117.60 €139.94Art.Nr: E80055The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.€117.60 €139.94 -
€113.50 €135.07Art.Nr: E80051Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.€113.50 €135.07 -
€105.20 €125.19Art.Nr: E80050Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.€105.20 €125.19 -
€41.50 €49.39Art.Nr: P80037Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€41.50 €49.39 -
€59.50 €70.81Art.Nr: P80036Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€59.50 €70.81
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€38.10 €45.34Art.Nr: P80035Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€38.10 €45.34
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€38.10 €45.34Art.Nr: P80020Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.€38.10 €45.34 -
€84.20 €100.20Art.Nr: P80014Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.€84.20 €100.20
