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Size Standards

(32)
    • €6,391.40 €7,605.77
      Art.Nr: E80127-1DC
      Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB. A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
      €6,391.40 €7,605.77
      • €1,297.30 €1,543.79
        Art.Nr: E80125-1D
        SPM Calibration Specimen, parallel ridges, 150nm nominal Abstand, A1 Lines on Glass, unmounted.
        €1,297.30 €1,543.79
        • €621.90 €740.06
          Art.Nr: E80124-HD
          SPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.
          €621.90 €740.06
          • €853.50 €1,015.67
            Art.Nr: E80124-EDU
            SPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
            €853.50 €1,015.67
            • €2,440.40 €2,904.08
              Art.Nr: E80111-31M
              SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.
              €2,440.40 €2,904.08
              • €2,219.20 €2,640.85
                Art.Nr: E80111-31
                SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.
                €2,219.20 €2,640.85
                • €1,532.20 €1,823.32
                  Art.Nr: E80110-72M
                  SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.
                  €1,532.20 €1,823.32
                  • €1,297.30 €1,543.79
                    Art.Nr: E80110-72
                    SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                    €1,297.30 €1,543.79
                    • €884.40 €1,052.44
                      Art.Nr: E80110-71M
                      SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.
                      €884.40 €1,052.44
                      • €725.90 €863.82
                        Art.Nr: E80110-71
                        SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                        €725.90 €863.82
                        • Art.Nr: E80110-32M
                          SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
                          • Art.Nr: E80110-32
                            SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                            • €1,096.50 €1,304.84
                              Art.Nr: E80110-31M
                              SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
                              €1,096.50 €1,304.84
                              • €861.60 €1,025.30
                                Art.Nr: E80110-31
                                SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
                                €861.60 €1,025.30
                                • Art.Nr: TL80069
                                  The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.
                                  • €117.60 €139.94
                                    Art.Nr: E80055
                                    The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.
                                    €117.60 €139.94
                                    • €113.50 €135.07
                                      Art.Nr: E80051
                                      Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.
                                      €113.50 €135.07
                                      • €105.20 €125.19
                                        Art.Nr: E80050
                                        Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.
                                        €105.20 €125.19
                                        • €41.50 €49.39
                                          Art.Nr: P80037
                                          Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                          €41.50 €49.39
                                          • €59.50 €70.81
                                            Art.Nr: P80036
                                            Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                            €59.50 €70.81
                                            • €38.10 €45.34
                                              Art.Nr: P80035
                                              Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.
                                              €38.10 €45.34
                                              • €38.10 €45.34
                                                Art.Nr: P80020
                                                Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.
                                                €38.10 €45.34
                                                • €84.20 €100.20
                                                  Art.Nr: P80014
                                                  Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.
                                                  €84.20 €100.20
                                                  • €21.50 €25.59
                                                    Art.Nr: E80010
                                                    Holey Carbon Film for measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various Sizes. On a 3.05mm copper grid.
                                                    €21.50 €25.59
                                                    • Art.Nr: P79526-10
                                                      These fine mesh grids are suitable for the low magnification range of a TEM.
                                                      • €76.60 €91.15
                                                        Art.Nr: E79525-02
                                                        These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.
                                                        €76.60 €91.15
                                                        • €41.50 €49.39
                                                          Art.Nr: P79525-01
                                                          These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.
                                                          €41.50 €49.39
                                                        • €610.10 €726.02
                                                          • €60.00 €71.40
                                                            Art.Nr: P79502-20
                                                            This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.
                                                            €60.00 €71.40
                                                            • €45.40 €54.03
                                                              Art.Nr: P79502-12
                                                              This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.
                                                              €45.40 €54.03