Size Standards
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€6,391.40 €7,605.77Art.Nr: E80127-1DCVery High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB. A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.€6,391.40 €7,605.77
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€1,297.30 €1,543.79Art.Nr: E80125-1DSPM Calibration Specimen, parallel ridges, 150nm nominal Abstand, A1 Lines on Glass, unmounted.€1,297.30 €1,543.79
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€621.90 €740.06Art.Nr: E80124-HDSPM Calibration Specimen, array of flat bumps, nominal Abstand: 750(X), 100(Z), Ni, unmounted.€621.90 €740.06
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€853.50 €1,015.67Art.Nr: E80124-EDUSPM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€853.50 €1,015.67
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€2,440.40 €2,904.08Art.Nr: E80111-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, mounted.€2,440.40 €2,904.08
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€2,219.20 €2,640.85Art.Nr: E80111-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, Ti lines on silica, unmounted.€2,219.20 €2,640.85
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€1,532.20 €1,823.32Art.Nr: E80110-72MSEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,532.20 €1,823.32
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€1,297.30 €1,543.79Art.Nr: E80110-72SEM Calibration Specimen, array of posts, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€1,297.30 €1,543.79
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€884.40 €1,052.44Art.Nr: E80110-71MSEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, mounted.€884.40 €1,052.44
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€725.90 €863.82Art.Nr: E80110-71SEM Calibration Specimen, parallel ridges, 700nm nominal Abstand, W-coated Photoresist on Si, unmounted.€725.90 €863.82
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Art.Nr: E80110-32MSEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.
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Art.Nr: E80110-32SEM Calibration Specimen, array of posts, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.
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€1,096.50 €1,304.84Art.Nr: E80110-31MSEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, mounted.€1,096.50 €1,304.84
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€861.60 €1,025.30Art.Nr: E80110-31SEM Calibration Specimen, parallel ridges, 300nm nominal Abstand, W-coated Photoresist on Si, unmounted.€861.60 €1,025.30
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Art.Nr: TL80069The MAG*I*CAL performs all major TEM calibrations: All TEM magnification ranges, Camera constant, Image Diffraction Pattern Rotation, Directly traceable to a natural constant. Magnification range from 1,000x to 1,000,000x.
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€117.60 €139.94Art.Nr: E80055The latex sphere is 0,261 microns and the grating replica is 2160 lines/mm. This calibration id allows you to double check the accuracy of magnification calibration.€117.60 €139.94
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€113.50 €135.07Art.Nr: E80051Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.The same ruling 2160 lines/mm, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion.€113.50 €135.07
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€105.20 €125.19Art.Nr: E80050Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9nm, 2160 lines per millimeter onto 3.05mm grid.€105.20 €125.19
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€41.50 €49.39Art.Nr: P80037Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€41.50 €49.39
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€59.50 €70.81Art.Nr: P80036Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€59.50 €70.81
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€38.10 €45.34Art.Nr: P80035Since crystal lattice plane spacings are accurately known from x-ray measurements, they provide a good test of microscope stability and a calibration of magnification in the upper range of magnification of the instrument.€38.10 €45.34
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€38.10 €45.34Art.Nr: P80020Evaporated Pt/Ir on Holey carbon film. Holey carbon film support provides holes for ease of focus and astigmatism correction. The dots of evaporated Pt/Ir provide dense particles for resolution checks through the particle seperation test.€38.10 €45.34
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€84.20 €100.20Art.Nr: P80014Catalase crystals are mounted on a grid and negatively stained. They display very clear lattice plane spacings of approx. 8.75nm and 6.85nm. Ideal for high magnification calibration.€84.20 €100.20
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€21.50 €25.59Art.Nr: E80010Holey Carbon Film for measuring and correcting astigmatism and for evaluating the resolution of the transmission electron microscope. A thin film of carbon has been treated to obtain numerous round holes of various Sizes. On a 3.05mm copper grid.€21.50 €25.59
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Art.Nr: P79526-10These fine mesh grids are suitable for the low magnification range of a TEM.
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€76.60 €91.15Art.Nr: E79525-02These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.€76.60 €91.15
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€41.50 €49.39Art.Nr: P79525-01These fine mesh grids are suitable for the low magnification range of a TEM. Available as a sandwich in a folding 3.05mm mesh grid.€41.50 €49.39
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€610.10 €726.02
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€60.00 €71.40Art.Nr: P79502-20This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.€60.00 €71.40
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€45.40 €54.03Art.Nr: P79502-12This Test Specimen is made of a 5x5mm square of single crystal silicon. It is photo-etched and the squares repeat every 10µm. The dividing lines are 1.9µm wide. A broader etching line is written every 500µm, which is useful in light microscopy.€45.40 €54.03